Bareisa E, Jusas V, Motiejunas K, Seinauskas R, Motiejunas L. Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults. ELEKTRON ELEKTROTECH [Internet]. 2012Feb.7 [cited 2024Nov.21];118(2):33-7. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/1179