Blyzniuk MB, Kazymyra IY. Probabilistic-based Defect/Fault Characterisation of Complex Gates from Standard Cell Library. ELEKTRON ELEKTROTECH [Internet]. 2004 Mar. 19 [cited 2026 Jan. 23];52(3). Available from: https://eejournal.ktu.lt/index.php/elt/article/view/10918