R., Beniseviciute, Deveika V., and Griska L. “Analysis of Possibilities of Faults Diagnostic by CMOS Integrated Circuits”. Elektronika ir Elektrotechnika 29, no. 6 (October 22, 2000). Accessed October 4, 2024. https://eejournal.ktu.lt/index.php/elt/article/view/18666.