Qiao, Hui, Bingxin Chen, Yaping Huang, Xuemei Qi, Hongming Fan, and Aiping Zeng. “A New Fault Recognition Method Based on Empirical Mode Decomposition and Texture Attributes”. Elektronika ir Elektrotechnika 31, no. 1 (February 24, 2025): 22–29. Accessed January 23, 2026. https://eejournal.ktu.lt/index.php/elt/article/view/36989.