Qiao, H., B. Chen, Y. Huang, X. Qi, H. Fan, and A. Zeng. “A New Fault Recognition Method Based on Empirical Mode Decomposition and Texture Attributes”. Elektronika Ir Elektrotechnika, vol. 31, no. 1, Feb. 2025, pp. 22-29, doi:10.5755/j02.eie.36989.