A. Beddiaf, M. Medjaldi, D. Djamai, and A. . Lanani, “Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model”, ELEKTRON ELEKTROTECH, vol. 31, no. 5, pp. 35–40, Oct. 2025, doi: 10.5755/j02.eie.39263.