H. Qiao, B. Chen, Y. Huang, X. Qi, H. Fan, and A. Zeng, “A New Fault Recognition Method Based on Empirical Mode Decomposition and Texture Attributes”, ELEKTRON ELEKTROTECH, vol. 31, no. 1, pp. 22–29, Feb. 2025, doi: 10.5755/j02.eie.36989.