[1]
D. Jucius, V. Grigaliūnas, and M. Margelevičius, “Investigation of Optical Properties of Submicrometer Lithographic Structures”, ELEKTRON ELEKTROTECH, vol. 27, no. 4, Aug. 2000, Accessed: Oct. 13, 2026. Available: https://eejournal.ktu.lt/index.php/elt/article/view/16858