[1]
A. Laurinavičius, Ž. Kancleris, T. Anbinderis, O. Martianova, and Y. Prishutov, “Millimeter Wave Technique for Non-destructive Characterization of Material Homogeneity”, ELEKTRON ELEKTROTECH, vol. 71, no. 7, pp. 59–62, Aug. 2006, Accessed: Jan. 23, 2026. [Online]. Available: https://eejournal.ktu.lt/index.php/elt/article/view/10774