[1]
A. Laurinavičius, Ž. Kancleris, T. Anbinderis, O. Martianova, and Y. Prishutov, “Millimeter Wave Technique for Non-destructive Characterization of Material Homogeneity”, ELEKTRON ELEKTROTECH, vol. 71, no. 7, pp. 59–62, Aug. 2006, doi: 10.5755/j02.eie.10774.