D. Andriukaitis, “Thermal Oxidation Process Influence to the V-MOS Structure”, ELEKTRON ELEKTROTECH, vol. 98, no. 2, pp. 45–48, Jan. 2010, Accessed: Jan. 23, 2026. [Online]. Available: https://eejournal.ktu.lt/index.php/elt/article/view/9923