Bareiša, E., Jusas, V., Motiejūnas, K. and Šeinauskas, R. (2006) “Functional Test Generation Procedures”, Elektronika ir Elektrotechnika, 72(8), pp. 43-48. Available at: https://eejournal.ktu.lt/index.php/elt/article/view/10787 (Accessed: 26April2024).