Blyzniuk, M. B. and Kazymyra, I. Y. (2004) “Probabilistic-based Defect/Fault Characterisation of Complex Gates from Standard Cell Library”, Elektronika ir Elektrotechnika, 52(3). Available at: https://eejournal.ktu.lt/index.php/elt/article/view/10918 (Accessed: 24November2024).