Hahanov, V.I., Kaminska, M.A. and Lavrova, O. (2007) “Testability Analysis of the VHDL Structure for Fault Coverage Improving”, Elektronika ir Elektrotechnika, 74(2), pp. 29–32. Available at: https://eejournal.ktu.lt/index.php/elt/article/view/10359 (Accessed: 7 February 2026).