ANDRIUKAITIS, D. Thermal Oxidation Process Influence to the V-MOS Structure. Elektronika ir Elektrotechnika, [S. l.], v. 98, n. 2, p. 45-48, 2010. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/9923. Acesso em: 5 oct. 2022.