NICKELSON, L.; BUCINSKAS, J. Microwave Diffraction Dependencies of a Conductor Cylinder Coated with Twelve Glass and Semiconductor Layers on the n-Si Specific Resistivity. Elektronika ir Elektrotechnika, [S. l.], v. 115, n. 9, p. 47-50, 2011. DOI: 10.5755/j01.eee.115.9.747. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/747. Acesso em: 24 apr. 2024.