BAREISA, E.; JUSAS, V.; MOTIEJUNAS, K.; SEINAUSKAS, R. An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits. Elektronika ir Elektrotechnika, [S. l.], v. 114, n. 8, p. 11-15, 2011. DOI: 10.5755/j01.eee.114.8.685. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/685. Acesso em: 29 apr. 2024.