SEINAUSKAS, R.; CVIRKA, R.; RUDZIONIENE, G. Acceleration of Fault Simulation based on a Separate List of Faults for each Test Pattern. Elektronika ir Elektrotechnika, [S. l.], v. 21, n. 3, p. 62-65, 2015. DOI: 10.5755/j01.eee.21.3.5774. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/5774. Acesso em: 6 oct. 2022.