CZAPP, S.; BOROWSKI, K. Immunity of Residual Current Devices to the Impulse Leakage Current in Circuits with Variable Speed Drives. Elektronika ir Elektrotechnika, [S. l.], v. 19, n. 8, p. 15-18, 2013. DOI: 10.5755/j01.eee.19.8.2883. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/2883. Acesso em: 29 sep. 2022.