ULLAH, N.; HUANG, L.; AMIRZADA, M. R. .; ULLAH, A. .; HAIDER, M. L. .; EHSAN, M. K. .; KHAN, Y. . Investigation of Leakage Current in Micro M-I-M Structure Using Multilayer High-K Dielectric Materials with COMSOL Multiphysics. Elektronika ir Elektrotechnika, [S. l.], v. 28, n. 2, p. 72-77, 2022. DOI: 10.5755/j02.eie.28102. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/28102. Acesso em: 7 jul. 2022.