BARUSU, M. R.; SETHURAJAN, U.; DEIVASIGAMANI, M. Diagnosis of Bearing Outer Race Faults Using a Low-Cost Non-Contact Method with Advanced Wavelet Transforms. Elektronika ir Elektrotechnika, [S. l.], v. 25, n. 1, p. 44-53, 2019. DOI: 10.5755/j01.eie.25.1.22735. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/22735. Acesso em: 19 mar. 2024.