BAREISA, E.; JUSAS, V.; MOTIEJUNAS, K.; SEINAUSKAS, R. On Delay Test Generation for Non-scan Sequential Circuits at Functional Level. Elektronika ir Elektrotechnika, [S. l.], v. 109, n. 3, p. 67-70, 2011. DOI: 10.5755/j01.eee.109.3.173. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/173. Acesso em: 25 sep. 2022.