BAREISA, E.; JUSAS, V.; MOTIEJUNAS, K.; SEINAUSKAS, R.; MOTIEJUNAS, L. Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults. Elektronika ir Elektrotechnika, [S. l.], v. 118, n. 2, p. 33-37, 2012. DOI: 10.5755/j01.eee.118.2.1179. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/1179. Acesso em: 1 mar. 2024.