VIŠNIAKOV, J.; MARCINKEVIČIUS, A. J. Investigation of Silicon Defects Parameters in Electron Irradiated Diodes. Elektronika ir Elektrotechnika, [S. l.], v. 76, n. 4, p. 13-16, 2007. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10707. Acesso em: 2 oct. 2022.