TAMOŠEVIČIUS, Ž. Testing of BIST Circuits. Elektronika ir Elektrotechnika, [S. l.], v. 63, n. 7, p. 75-79, 2005. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10503. Acesso em: 25 sep. 2022.