ANILIONIS, R.; ANDRIUKAITIS, D.; KERŠYS, T. The Analysis of Quality of CMOS Technology, Covered by Silicon Nitride. Elektronika ir Elektrotechnika, [S. l.], v. 60, n. 4, p. 69-73, 2005. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10411. Acesso em: 20 apr. 2024.