HAHANOV, V. I.; KAMINSKA, M. A.; LAVROVA, O. Testability Analysis of the VHDL Structure for Fault Coverage Improving. Elektronika ir Elektrotechnika, [S. l.], v. 74, n. 2, p. 29-32, 2007. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10359. Acesso em: 11 oct. 2024.