AVAKAW, S. M. Sub-Pixel Resolution by Die to Database Reticle Inspection. Elektronika ir Elektrotechnika, [S. l.], v. 79, n. 7, p. 45-48, 2007. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10837. Acesso em: 7 apr. 2025.