QIAO, H.; CHEN, B.; HUANG, Y.; QI, X.; FAN, H.; ZENG, A. A New Fault Recognition Method Based on Empirical Mode Decomposition and Texture Attributes. Elektronika ir Elektrotechnika, [S. l.], v. 31, n. 1, p. 22-29, 2025. DOI: 10.5755/j02.eie.36989. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/36989. Acesso em: 4 apr. 2025.