STUPAK, V. Reliability of Electronic Devices at Early Stages of Life Cycle. Elektronika ir Elektrotechnika, [S. l.], v. 112, n. 6, p. 57-60, 2011. DOI: 10.5755/j01.eee.112.6.445. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/445. Acesso em: 7 apr. 2025.