BALAISIS, R.; EIDUKAS, D.; NAVIKAS, D. Evaluation of Electronic Device No-Failure. Elektronika ir Elektrotechnika, [S. l.], v. 13, n. 4, 1997. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/15873. Acesso em: 6 may. 2025.