BALAISIS, P.; EIDUKAS, D.; NAVIKAS, D. Systematic Research of Electronic Device Reliability. Elektronika ir Elektrotechnika, [S. l.], v. 12, n. 3, 1997. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/15856. Acesso em: 22 nov. 2024.