HUZUM, C.; CASCAVAL, P. March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories. Elektronika ir Elektrotechnika, [S. l.], v. 119, n. 3, p. 81-86, 2012. DOI: 10.5755/j01.eee.119.3.1369. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/1369. Acesso em: 22 dec. 2024.