Investigation of Leakage Current in Micro M-I-M Structure Using Multilayer High-K Dielectric Materials with COMSOL Multiphysics. Elektronika ir Elektrotechnika, [S. l.], v. 28, n. 2, p. 72–77, 2022. DOI: 10.5755/j02.eie.28102. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/28102.. Acesso em: 5 dec. 2025.