LU, Zhimin; YANG, Xueliang; JIANG, Jingqiang; LI, Wencan; ZHANG, Weiwei; HUANG, Mengling. A Deep Learning-based Method for Production Carton Packaging Defect Detection. Elektronika ir Elektrotechnika, [S. l.], v. 1, n. 1, 2026. DOI: 10.5755/j02.eie.45566. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/45566.. Acesso em: 7 sep. 2026.