Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults. Elektronika ir Elektrotechnika, [S. l.], v. 118, n. 2, p. 33–37, 2012. DOI: 10.5755/j01.eee.118.2.1179. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/1179.. Acesso em: 5 dec. 2025.