Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit. Elektronika ir Elektrotechnika, [S. l.], v. 25, n. 3, p. 25–33, 2019. DOI: 10.5755/j01.eie.25.3.23672. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/23672.. Acesso em: 5 dec. 2025.