The Impact of DC Earth Fault Current Shape on Tripping of Residual Current Devices. Elektronika ir Elektrotechnika, [S. l.], v. 84, n. 4, p. 9–12, 2008. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/11095.. Acesso em: 5 dec. 2025.