BLYZNIUK, M. B.; KAZYMYRA, I. Y. Probabilistic-based Defect/Fault Characterisation of Complex Gates from Standard Cell Library. Elektronika ir Elektrotechnika, [S. l.], v. 52, n. 3, 2004. DOI: 10.5755/j02.eie.10918. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10918.. Acesso em: 5 may. 2026.