BULBENKIENĖ, V.; PŪRAS, R.; SAKALAUSKAS, S. Analysis of Surface Microdefects Localization Possibilities. Elektronika ir Elektrotechnika, [S. l.], v. 70, n. 6, p. 87–90, 2006. DOI: 10.5755/j02.eie.10699. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10699.. Acesso em: 11 jun. 2026.