TAMOŠEVIČIUS, Ž. Testing of BIST Circuits. Elektronika ir Elektrotechnika, [S. l.], v. 63, n. 7, p. 75–79, 2005. DOI: 10.5755/j02.eie.10503. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10503.. Acesso em: 10 jun. 2026.