JUSAS, V.; PAULIKAS, K.; ŠEINAUSKAS, R. Test Design for Black-Box Models. Elektronika ir Elektrotechnika, [S. l.], v. 63, n. 7, p. 35–35, 2005. DOI: 10.5755/j02.eie.10497. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10497.. Acesso em: 11 jun. 2026.