Beddiaf, A.; Medjaldi, M.; Djamai, D.; Lanani, A. . Optical Characterization of Silicon Nitride-Based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model. ELEKTRON ELEKTROTECH 2025, 31 (5), 35-40. https://doi.org/10.5755/j02.eie.39263.