Sakalauskaite, A.; Pranevicius, H.; Pranevicius, M.; Bukauskas, F. Markovian Model of the Voltage Gating of Connexin-Based Gap Junction Channels. ELEKTRON ELEKTROTECH 2011, 111 (5), 103-106. https://doi.org/10.5755/j01.eee.111.5.367.