TY - JOUR AU - Kalnius, R. PY - 1997/11/28 Y2 - 2024/03/29 TI - Probability Models of Control Characteristics of Radioelectronic Devices JF - Elektronika ir Elektrotechnika JA - ELEKTRON ELEKTROTECH VL - 13 IS - 4 SE - DO - UR - https://eejournal.ktu.lt/index.php/elt/article/view/15874 SP - AB - <span>There have been created probability models of continuous control characteristics,evaluating classification mistakes, for repairable and unrepairable radioelectronic devices. These models enable to normalize control characteristics and to evaluate control losses caused by classification mistakes.</span> ER -