@article{Bareisa_Jusas_Motiejunas_Seinauskas_2011, title={On Delay Test Generation for Non-scan Sequential Circuits at Functional Level}, volume={109}, url={https://eejournal.ktu.lt/index.php/elt/article/view/173}, DOI={10.5755/j01.eee.109.3.173}, abstractNote={Sequential circuit testing has been recognized as the most difficult problem in the area of fault detection. High-performance circuits with aggressive timing constraints are usually very susceptible to delay faults. We investigated the application of tests that are generated at functional level for detection of gate-level transition faults. Based on experimental results, we developed a framework of delay test generation for non-scan sequential circuits. The provided comparison with experimental results of other approaches demonstrates the effectiveness of proposed framework. Bibl. 13, tabl. 4 (in English; abstracts in English and Lithuanian).<p><a href="http://dx.doi.org/10.5755/j01.eee.109.3.173">http://dx.doi.org/10.5755/j01.eee.109.3.173</a></p>}, number={3}, journal={Elektronika ir Elektrotechnika}, author={Bareisa, E. and Jusas, V. and Motiejunas, K. and Seinauskas, R.}, year={2011}, month={Mar.}, pages={67-70} }