@article{Bareiša_Jusas_Motiejūnas_Šeinauskas_2007, title={Functional Delay Test Construction Approaches}, volume={74}, url={https://eejournal.ktu.lt/index.php/elt/article/view/10370}, abstractNote={<p>It is explored how functional delay tests constructed at algorithmic level detect transition faults at gate-level. Main attention was paid to investigation of the possibilities to improve the transition fault coverage using n-detection functional delay fault tests. The proposed functional delay test construction approaches allowed achieving 99 % transition fault coverage which is acceptable even for manufacturing test. Bibl. 18 (in English; summaries in English, Russian and Lithuanian).</p>}, number={2}, journal={Elektronika ir Elektrotechnika}, author={Bareiša, E. and Jusas, V. and Motiejūnas, K. and Šeinauskas, R.}, year={2007}, month={Feb.}, pages={49-54} }