Muravov S, Voronov S, Bogorosh A, Royzman V, Bubulis A. Microrelations for Diagnostic Devices. ELEKTRON ELEKTROTECH [Internet]. 2008Oct.20 [cited 2024Apr.26];88(8):29-32. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/11228