Bareisa, E., V. Jusas, K. Motiejunas, R. Seinauskas, and L. Motiejunas. “Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults”. Elektronika ir Elektrotechnika 118, no. 2 (February 7, 2012): 33-37. Accessed April 20, 2024. https://eejournal.ktu.lt/index.php/elt/article/view/1179.