R., B.; V., D.; L., G. Analysis of Possibilities of Faults Diagnostic by CMOS Integrated Circuits. Elektronika ir Elektrotechnika, [S. l.], v. 29, n. 6, 2000. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/18666. Acesso em: 25 apr. 2024.