BAGDANAVIČIUS, N.; ŽICKIS, A.; BARYSAITĖ, I. Statistical Evaluation of No-Failure and Efficiency of Electronic Devices. Elektronika ir Elektrotechnika, [S. l.], v. 53, n. 4, 2004. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10899. Acesso em: 28 mar. 2024.